中圖分類號： TN407 文獻標(biāo)識碼： A DOI：10.16157/j.issn.0258-7998.201215 中文引用格式： 翟鵬飛,，周雄,，李強. 片上電源電壓噪聲功率譜測量方法綜述[J].電子技術(shù)應(yīng)用，2021,，47(8)：30-33,，38. 英文引用格式： Zhai Pengfei，Zhou Xiong,，Li Qiang. Review of on chip power supply noise power spectrum measurement[J]. Application of Electronic Technique,，2021，47(8)：30-33,，38.
Review of on chip power supply noise power spectrum measurement
Zhai Pengfei1,，Zhou Xiong1,，Li Qiang1，2
1.School of Electronic Science and Engineering,，University of Electronic Science and Technology of China,，Chengdu 610054，China,； 2.Pazhou Lab,，Guangdong Artificial Intelligence and Digital Economy Loboratory，Guangzhou 510330,，China
Abstract： As the complexity of power delivery network in modern VLSI, the on-chip measurement of the noise power spectrum of each power domain becomes more meaningful. The difficulty of the on-chip power supply noise measurement is mainly to measure the noise in a very wide frequency range with high accuracy under the condition of small area and power consumption overhead. This paper introduces the principle of measuring the power supply noise spectrum based on the autocorrelation, and summarizes the main circuit techniques currently used for power supply noise measurement, and discusses the advantages and disadvantages of related structures, which provides a useful reference for VLSI designers.
Key words : power supply noise,；power delivery network；power spectrum measurement,；autocorrelation
