單極性ADC靜態(tài)參數(shù)的測試方法
電子技術應用
朱清,,韋凱,,陶青平
中國電子科技集團公司第五十八研究所, 江蘇 無錫 214035
摘要: 模數(shù)轉(zhuǎn)換器(ADC)的靜態(tài)指標包括微分非線性(DNL)和積分非線性(INL),,測量靜態(tài)參數(shù)的主要方法為碼密度直方圖法,。傳統(tǒng)的碼密度直方圖法對輸入正弦波的幅值的計算精度有較高的要求,提出了一種基于碼密度直方圖的歸一化處理的平臺方案,。根據(jù)測試要求,,選取符合要求的測試激勵幅值輸入,從而對歸一化處理后的方案有效性進行驗證,。實驗結(jié)果表明進行歸一化處理降低了正弦波幅值的變化對于碼密度直方圖法的影響,,提高了碼密度直方圖法測試的穩(wěn)定性。
中圖分類號:TP391 文獻標志碼:A DOI: 10.16157/j.issn.0258-7998.234474
中文引用格式: 朱清,,韋凱,,陶青平. 單極性ADC靜態(tài)參數(shù)的測試方法[J]. 電子技術應用,2024,,50(2):60-64.
英文引用格式: Zhu Qing,,Wei Kai,Tao Qingping. Test method for static parameter of unipolar ADC[J]. Application of Electronic Technique,,2024,,50(2):60-64.
中文引用格式: 朱清,,韋凱,,陶青平. 單極性ADC靜態(tài)參數(shù)的測試方法[J]. 電子技術應用,2024,,50(2):60-64.
英文引用格式: Zhu Qing,,Wei Kai,Tao Qingping. Test method for static parameter of unipolar ADC[J]. Application of Electronic Technique,,2024,,50(2):60-64.
Test method for static parameter of unipolar ADC
Zhu Qing,Wei Kai,,Tao Qingping
China Electronics Technology Group Corporation No.58 Research Institute,, Wuxi 214035, China
Abstract: The static parameters of analog to digital converter (ADC) include differential nonlinearity (DNL) and integral nonlinearity (INL). The main method to measure static parameters is the code density histogram method.The traditional code density histogram method has high requirements on the calculation accuracy of input sinusoidal amplitude. This paper proposes a normalized processing platform scheme based on code density histogram. According to the test requirements, the test excitation amplitude that meets the requirements is selected to verify the effectiveness of the normalized scheme.The experimental results show that normalization reduces the influence of sinusoidal amplitude change on the code density histogram method and improves the stability of the code density histogram method.
Key words : analog to digital converter,;differential nonlinearity,;integral nonlinearity;code density histogram;normalized
引言
隨著MCU和CPU的發(fā)展,,集成模數(shù)轉(zhuǎn)換器的芯片越來越多,,性能也越來越好,快速有效并且穩(wěn)定地驗證高性能片上模數(shù)轉(zhuǎn)換器(Analog-to-Digital Converter,,ADC)的性能變得尤為重要,。INL和DNL[1-2]作為模數(shù)轉(zhuǎn)換器靜態(tài)參數(shù)的重要指標,成為評價片上模數(shù)轉(zhuǎn)換器性能好壞的關鍵,。但是相比于單芯片ADC測試,,片上集成ADC測試[3-4]的干擾因素變多,測試的環(huán)境更加復雜,,對測試方法和測試設備的要求更加嚴苛,。
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作者信息:
朱清,韋凱,,陶青平
中國電子科技集團公司第五十八研究所,, 江蘇 無錫 214035
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