中圖分類號(hào)： TN402 文獻(xiàn)標(biāo)識(shí)碼： A DOI：10.16157/j.issn.0258-7998.201230 中文引用格式： 翟鵬飛,，周雄,，李強(qiáng). 用于SoC電源噪聲測(cè)量的低溫漂VCO[J].電子技術(shù)應(yīng)用，2021,，47(6)：46-50,，61. 英文引用格式： Zhai Pengfei,，Zhou Xiong，Li Qiang. A low temperature drift VCO for SoC power supply noise measurement[J]. Application of Electronic Technique,，2021,，47(6)：46-50，61.
A low temperature drift VCO for SoC power supply noise measurement
Zhai Pengfei1,，Zhou Xiong1,，Li Qiang1，2
1.School of Electronic Science and Engineering,，University of Electronic Science and Technology of China,，Chengdu 610054,，China,； 2.Pazhou Lab(Guangdong Artificial Intelligence and Digital Economy Laboratory(Guangzhou))，Guangzhou 510330,，China
Abstract： This paper presents a two-stage temperature compensated ring VCO-based quantizer for on-chip power supply noise measurement. To achieve a lower temperature coefficient, the coarse and fine temperature compensated stages are both exploited. In the coarse stage, a proportional-to-absolute-temperature(PTAT) current injects in the current starved ring VCO to compensate the large part of the temperature coefficient of the VCO, and as the fine compensated stage, a replica VCO is employed to sense temperature variation and further adjust the oscillation frequency of the VCO adaptively. The ring VCO-based quantizer is operated at a 1.1 V supply. The simulation results show the output frequency of the VCO is 4.3 GHz, and it achieves a low temperature sensitivity of 15.5 ppm/℃ over the range from -40 ℃ to 125 ℃ with the two-stage temperature compensation.
Key words : temperature compensation,；ring oscillator；VCO-based quantizer,；power supply noise measurement
