芯片樣品驗證平臺自適應(yīng)和同步測試功能的設(shè)計與實現(xiàn)
2023年電子技術(shù)應(yīng)用第2期
徐靖林,,王棟,,魏斌,王赟,,竇志軍,,成嵩
北京智芯微電子科技有限公司,北京 100192
摘要: 目前,,芯片設(shè)計公司在對量產(chǎn)級的芯片進行樣品驗證時,傳統(tǒng)的樣品驗證方法大多是基于芯片自身特點來設(shè)計相應(yīng)的測試設(shè)備,,然后通過測試夾具對芯片樣品逐一測試,,不同的芯片會設(shè)計不同的測試設(shè)備。提出了一種自適應(yīng)且可同步測試的樣品驗證平臺方案,,既可以實現(xiàn)同時測試多顆芯片,,也可以對不同接口的芯片進行測試;既可以進行可靠性實驗測試,,也可以進行其他功能的測試,,大大節(jié)省了測試設(shè)備的維護成本,提高測試效率,。
中圖分類號:TN06
文獻標(biāo)志碼:A
DOI: 10.16157/j.issn.0258-7998.223053
中文引用格式: 徐靖林,,王棟,魏斌,,等. 芯片樣品驗證平臺自適應(yīng)和同步測試功能的設(shè)計與實現(xiàn)[J]. 電子技術(shù)應(yīng)用,,2023,49(2):55-60.
英文引用格式: Xu Jinglin,,Wang Dong,,Wei Bin,et al. Design and implementation of adaptive and synchronous test function of chip sample verification platform[J]. Application of Electronic Technique,,2023,,49(2):55-60.
文獻標(biāo)志碼:A
DOI: 10.16157/j.issn.0258-7998.223053
中文引用格式: 徐靖林,,王棟,魏斌,,等. 芯片樣品驗證平臺自適應(yīng)和同步測試功能的設(shè)計與實現(xiàn)[J]. 電子技術(shù)應(yīng)用,,2023,49(2):55-60.
英文引用格式: Xu Jinglin,,Wang Dong,,Wei Bin,et al. Design and implementation of adaptive and synchronous test function of chip sample verification platform[J]. Application of Electronic Technique,,2023,,49(2):55-60.
Design and implementation of adaptive and synchronous test function of chip sample verification platform
Xu Jinglin,Wang Dong,,Wei Bin,,Wang Yun,Dou Zhijun,Cheng Song
Beijing Smart-Chip Microelectronics Technology Co.,, Ltd.,, Beijing 100192, China
Abstract: At present, in chip design companies, sample verification is carried out for mass production chips. Most of the traditional sample verification methods design corresponding test equipment based on the characteristics of the chip, and then test the chip samples one by one through the test fixture. Different chips will design different test equipment. In this paper, an adaptive and synchronous test sample verification platform scheme is proposed, which can not only test multiple chips at the same time, but also test chips with different interfaces. It can not only test the reliability experiment, but also test other functions, which greatly saves the maintenance cost of test equipment and improves the test efficiency.
Key words : adaptive,;synchronous test,;sample verification;test platform
0 引言
隨著芯片行業(yè)的快速發(fā)展,,在芯片設(shè)計公司,,芯片測試貫穿于整個設(shè)計生產(chǎn)過程中,測試驗證是芯片設(shè)計中非常重要的一部分,。當(dāng)芯片量產(chǎn)回來,,首要的任務(wù)是對芯片所有的功能和性能進行充分的測試驗證,只有經(jīng)過全面驗證達到預(yù)期的設(shè)計指標(biāo),,才能推進市場,。而對于量產(chǎn)級的芯片,驗證通常選取一定比例數(shù)量來進行抽樣測試,。
目前,,傳統(tǒng)的芯片樣品驗證,在行業(yè)內(nèi)大多是基于自身芯片特征設(shè)計相應(yīng)的測試設(shè)備,,通過測試夾具來逐一測試,,針對不同的芯片需要設(shè)計不同的測試設(shè)備。圖1為傳統(tǒng)的芯片樣品驗證單板測試電路結(jié)構(gòu),。單板測試對于樣品數(shù)量要求多,、測試時間長的測試項目來說,搭建環(huán)境,、測試儀器設(shè)備的利用率以及時間配置完全不占優(yōu)勢,,大大降低了測試效率,導(dǎo)致項目周期延長,。
本文詳細內(nèi)容請下載:http://forexkbc.com/resource/share/2000005169,。
作者信息:
徐靖林,王棟,,魏斌,,王赟,竇志軍,,成嵩
(北京智芯微電子科技有限公司,,北京 100192)
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