集成電路產(chǎn)業(yè)的多源數(shù)據(jù)融合前沿識別研究
電子技術(shù)應(yīng)用
張 倩
(北京市科學(xué)技術(shù)研究院,,北京 100089)
摘要: 大數(shù)據(jù)時代,,能夠精準(zhǔn)及時地識別研究前沿對于科技戰(zhàn)略的定位和科研方向的部署尤為重要,可提供更加全面的決策參考和依據(jù),。利用自開發(fā)的多源數(shù)據(jù)融合分析方法,,從全球期刊論文、會議論文,、專利文獻(xiàn),、科技新聞、研究報告,、科技政策,、標(biāo)準(zhǔn)等數(shù)據(jù)進(jìn)行數(shù)據(jù)挖掘和去噪,有效識別出集成電路領(lǐng)域當(dāng)前的研究前沿和技術(shù)清單,。當(dāng)前全球集成電路領(lǐng)域的研究熱點和重點發(fā)展方向集中在半導(dǎo)體制造設(shè)備,、高制程制造技術(shù)上,重點產(chǎn)品集中在高端芯片,、功率器件,、傳感器、存儲器以及第三代半導(dǎo)體的相關(guān)產(chǎn)品上,。中國半導(dǎo)體產(chǎn)業(yè)國產(chǎn)化迫在眉睫,,前沿識別結(jié)果為政府與企業(yè)提供有價值的決策支持和參考。
中圖分類號:TP18,;TN40 文獻(xiàn)標(biāo)志碼:A DOI: 10.16157/j.issn.0258-7998.233806
中文引用格式: 張倩. 集成電路產(chǎn)業(yè)的多源數(shù)據(jù)融合前沿識別研究[J]. 電子技術(shù)應(yīng)用,,2023,49(10):35-39.
英文引用格式: Zhang Qian. Research on frontier identification of multi-source data fusion in the integrated circuit industry[J]. Application of Electronic Technique,,2023,,49(10):35-39.
中文引用格式: 張倩. 集成電路產(chǎn)業(yè)的多源數(shù)據(jù)融合前沿識別研究[J]. 電子技術(shù)應(yīng)用,,2023,49(10):35-39.
英文引用格式: Zhang Qian. Research on frontier identification of multi-source data fusion in the integrated circuit industry[J]. Application of Electronic Technique,,2023,,49(10):35-39.
Research on frontier identification of multi-source data fusion in the integrated circuit industry
Zhang Qian
(Beijing Academy of Science and Technology, Beijing 100089,, China)
Abstract: In the era of big data, accurate and timely identification of research frontiers is particularly important for the positioning of science and technology strategy and the deployment of scientific research direction, which can provide more comprehensive reference and basis for decision-making. The self-developed multi-source data fusion analysis method was used to conduct data mining and denoising from global journal papers, conference papers, patent literature, science and technology news, research reports, science and technology policies, standards and other data. The list of current research frontiers and technologies in the field of IC was effectively identified. At present, the research hotspot and development direction of global integrated circuit field are concentrated on semiconductor manufacturing equipment and high process manufacturing technology, and the focus is on high-end chips, power devices, sensors, memory and third-generation semiconductor related products. The localization of China's semiconductor industry is imminent. The results of frontier identification provide valuable decision support and reference for the government and enterprises.
Key words : research frontier,;multi source fusion;knowledge discovery;integrated circuit
0 引言
科學(xué)技術(shù)的發(fā)展日新月異,,是推動當(dāng)今社會生產(chǎn)力發(fā)展的主要因素,,因此有效識別重要領(lǐng)域的研究前沿和新興技術(shù)顯得尤為重要,應(yīng)該做到及時性,、準(zhǔn)確性和全面性,從而為國家科技戰(zhàn)略決策提供有力支撐,。
本文結(jié)合情報研究方法和其他學(xué)科研究方法,,將多個數(shù)據(jù)源進(jìn)行融合處理,即通過不同渠道,、多種采集方式獲取的具有不同數(shù)據(jù)結(jié)構(gòu)的信息匯聚到一起,,形成具有統(tǒng)一格式、面向多種應(yīng)用的數(shù)據(jù)集合 [1],。采用多源數(shù)據(jù)融合分析識別研究前沿是當(dāng)前情報學(xué)領(lǐng)域的研究重點,,做到準(zhǔn)確有效地把握研究前沿,能夠為政府及企業(yè)相關(guān)部門制定科技政策和戰(zhàn)略部提供更加全面的決策依據(jù)和參考[2-3],。
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作者信息:
張倩
(北京市科學(xué)技術(shù)研究院,,北京 100089)
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